发明名称 INTEGRATED FIELD EFFECT TRANSISTORS WITH HIGH VOLTAGE DRAIN SENSING
摘要 An integrated circuit includes a junction field effect transistor (JFET) and a power metal oxide semiconductor field effect transistor (MOSFET) on a same substrate. The integrated circuit includes a drain sense terminal for sensing the drain of the power MOSFET through the JFET. The JFET protects a controller or other electrical circuit coupled to the drain sense terminal from high voltage that may be present on the drain of the power MOSFET. The JFET and the power MOSFET share a same drift region, which includes an epitaxial layer formed on the substrate. The integrated circuit may be packaged in a four terminal small outline integrated circuit (SOIC) package. The integrated circuit may be employed in a variety of applications including as an ideal diode.
申请公布号 US2013187160(A1) 申请公布日期 2013.07.25
申请号 US201213355324 申请日期 2012.01.20
申请人 LI TIESHENG 发明人 LI TIESHENG
分类号 H01L27/088;H01L21/334 主分类号 H01L27/088
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