发明名称 HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
摘要 <p>PURPOSE: A transistor with high electron mobility and a manufacturing method thereof are provided to easily control the size, position, and depth of a high resistive area by forming the high resistive area through the injection of an impurity. CONSTITUTION: An insulation layer (IL1) is formed on a substrate (SUB1). A gate electrode (G1), a source electrode (S1) and a drain electrode (D1) are formed on the insulation layer. A channel supply layer (CS1) is formed on the insulation layer to contact the gate electrode, the source electrode, and the drain electrode. A channel layer including a two-dimensional electron gas is formed on the channel supply layer. The channel layer includes an effective channel area in contact with the channel supply layer and a high resistive area formed on the effective channel area.</p>
申请公布号 KR20130082306(A) 申请公布日期 2013.07.19
申请号 KR20120003446 申请日期 2012.01.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, HYUK SOON;KIM, JONG SEOB;SHIN, JAI KWANG;UM, CHANG YONG;OH, JAE JOON;HA, JONG BONG;HONG, KI HA;HWANG, IN JUN
分类号 H01L29/778;H01L21/335 主分类号 H01L29/778
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