SOLID DEVICE WITH A ONE-DIMENSIONAL EXTREMITY FOR NEAR-FIELD OPTICAL SPECTROSCOPY AND MICROSCOPY

摘要

The subject matter (figure 1) is a solid device with a one-dimensional extremity for near-field optical spectroscopy and microscopy. This device comprises a solid probe that may be used, preferably, in scanning-probe microscopy and spectroscopy techniques and equipment. The device proposed (figure 1) is suitably dimensioned to couple with the electrical light field propagated preferably in the direction normal to the surface to be analyzed. The subject matter (figure 1) is sufficiently robust for the surface analysis process, and is able to provide high-resolution analysis of nanometric structures.