发明名称 PROBE CARD AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a probe card and a manufacturing method thereof.SOLUTION: A probe card includes an insulation substrate having a plurality of signal conductors and a groove formed on the insulation substrate which surrounds the signal conductors. The probe card causes no signal disturbance due to leakage current.
申请公布号 JP2013130559(A) 申请公布日期 2013.07.04
申请号 JP20120054239 申请日期 2012.03.12
申请人 SAMSUNG ELECTRO-MECHANICS CO LTD 发明人 OH KWAN-JIE;KIM CHE-YON
分类号 G01R1/073;H01L21/66 主分类号 G01R1/073
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