发明名称 NANOIMPRINT LITHOGRAPHY APPARATUS AND NANOIMPRINT LITHOGRAPHY METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a nanoimprint lithography apparatus capable of correcting the partial error and the scale error of a stamp and a substrate. <P>SOLUTION: A stamp 130 having a pattern to be imprinted on a substrate is provided with a plurality of posts 202 on the surface opposite from the patterned surface. The posts 202 are connected with an actuator 204. When the actuator 204 is driven, the interval between the adjoining posts 202 changes, and the stamp 130 is deformed. Consequently, the partial error where a part of the stamp 130 does not match the corresponding part of the substrate in the size or the shape, and the scale error where the stamp 130 does not match the substrate in the size can be corrected. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013120941(A) 申请公布日期 2013.06.17
申请号 JP20120267077 申请日期 2012.12.06
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 CHO YOUNG TAE;PARK EUN AH;LEE SUNG HOON;LEE SOON WON
分类号 H01L21/027;B29C59/00 主分类号 H01L21/027
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