发明名称 |
SILICON CARBIDE SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a silicon carbide semiconductor device which can tightly fix a support substrate. <P>SOLUTION: A manufacturing method of a silicon carbide semiconductor device 100 comprises the steps of: preparing a silicon carbide substrate 1 having a first principal surface 2 and a second principal surface 3; forming an ion implantation layer 4 at a predetermined depth from the first principal surface 2 of the silicon carbide substrate 1 by implantation of ion into the first principal surface 2; bonding via an intermediate layer 6, the silicon carbide substrate 1 and a support substrate 7 composed of a silicon carbide; removing a second layer 9 by separating the silicon carbide substrate 1 with sandwiching the ion implantation layer 4 into a first layer 8 bonded to the support substrate 7 via the intermediate layer 6 and the second layer 9 having the second principal surface 3; forming a silicon carbide layer 12 on the first layer 8; and removing the support substrate 7. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013118247(A) |
申请公布日期 |
2013.06.13 |
申请号 |
JP20110264334 |
申请日期 |
2011.12.02 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
HAYASHI HIDEKI |
分类号 |
H01L21/02;H01L21/20;H01L21/265;H01L21/336;H01L29/12;H01L29/78 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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