发明名称 A LITHOGRAPHY APPARATUS, AN APPARATUS FOR PROVIDING SETPOINT DATA, A DEVICE MANUFACTURING METHOD, A METHOD OF CALCULATING SETPOINT DATA AND A COMPUTER PROGRAM.
摘要 An exposure apparatus configured to project each of a plurality of radiation beams onto a respective location on a target, the plurality of radiation beams forming a desired dose pattern via a plurality of spot exposures, the nominal position of a characteristic point in the dose distribution of each of the spot exposures lying at points defining a first grid. The apparatus has, or is provided data from, a controller configured to: calculate a target intensity value for each of the plurality of radiation beams to expose the target to the desired dose pattern, the calculation using as input a rasterized representation of the desired dose pattern, the rasterized representation including a dose value defined at each of a plurality of points on a second grid, the first and second grids having the same geometry, and control the exposure apparatus to emit beams with the target intensity values.
申请公布号 NL2009817(A) 申请公布日期 2013.06.10
申请号 NL20122009817 申请日期 2012.11.15
申请人 ASML NETHERLANDS B.V. 发明人 TINNEMANS PATRICIUS;MULCKHUYSE WOUTER
分类号 G03F7/20 主分类号 G03F7/20
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