发明名称 Semiconductor device
摘要 In the interior of a semiconductor substrate having a main surface, a first p - epitaxial region is formed, a second p - epitaxial region is formed on the main surface side, and an n-type drift region and a p-type body region are formed on the main surface side. An n + buried region is formed between the first p - epitaxial region and the second p - epitaxial region in order to electrically isolate the regions. A p + buried region having a p-type impurity concentration higher than that of the second p - epitaxial region is formed between the n + buried region and the second p - epitaxial region. The p + buried region is located at least immediately under the junction between the n-type drift region and the p-type body region so as to avoid a site immediately under a drain region which is in contact with the n-type drift region.
申请公布号 EP2597680(A2) 申请公布日期 2013.05.29
申请号 EP20120193092 申请日期 2012.11.16
申请人 RENESAS ELECTRONICS CORPORATION 发明人 YANAGI, SHINICHIRO
分类号 H01L29/78;H01L29/06;H01L29/10 主分类号 H01L29/78
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