| 摘要 |
<p>A diffractometer and diffracted X-ray intensity correction method are provided. The method includes the steps of focusing X-rays on a sample for correction placed at a gonio center S0, detecting fluorescent X-rays excited by the focused X-rays at detector 20 via a raster element 10, formed by poly-capillaries and having a unique focal point. Since fluorescent X-rays are used it is possible to adjust the position of the raster element utilizing the fact that if the focal point of the raster element coincides with the gonio center, the intensity becomes uniform regardless of the detected position. This makes it possible to easily adjust the raster element to an optimum position and to make the background uniform for subsequent measurement of X-rays diffracted from a sample. A further embodiment allows for the detector and raster element to be moved together, for example on arm 30.</p> |
