发明名称 |
COMPOUND, RESIN AND PHOTORESIST COMPOSITION |
摘要 |
<p>PURPOSE: A photoresist composition is provided to provide a fine photoresist pattern with excellent exposure latitude. CONSTITUTION: A resin includes a structure unit represented by chemical formula aa. In the chemical formula aa: T^1 is a substituted or non-substituted C3-34 sultone cyclic group; X^1 is -O- or -N(R^c)-; R^c is hydrogen or a C1-6 alkyl group; Z^1 is X^2 or -X^3-X^4-CO-X^5- where each of X^2, X^3, and X^5 is a C1-6 alkanediyl group, and X^4 is -O- or -N(R^d)-; R^d is hydrogen or a C1-6 alkyl group; and R^1 is hydrogen, halogen, or a C1-6 alkyl group capable of including halogen. A photoresist composition includes the resin.</p> |
申请公布号 |
KR20130039690(A) |
申请公布日期 |
2013.04.22 |
申请号 |
KR20120112391 |
申请日期 |
2012.10.10 |
申请人 |
SUMITOMO CHEMICAL CO., LTD. |
发明人 |
ICHIKAWA KOJI;SAKAMOTO HIROMU;FUJITA SHINGO |
分类号 |
C08F20/26;C08L33/04;G03F7/033;G03F7/20 |
主分类号 |
C08F20/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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