发明名称 COMPOUND, RESIN AND PHOTORESIST COMPOSITION
摘要 <p>PURPOSE: A photoresist composition is provided to provide a fine photoresist pattern with excellent exposure latitude. CONSTITUTION: A resin includes a structure unit represented by chemical formula aa. In the chemical formula aa: T^1 is a substituted or non-substituted C3-34 sultone cyclic group; X^1 is -O- or -N(R^c)-; R^c is hydrogen or a C1-6 alkyl group; Z^1 is X^2 or -X^3-X^4-CO-X^5- where each of X^2, X^3, and X^5 is a C1-6 alkanediyl group, and X^4 is -O- or -N(R^d)-; R^d is hydrogen or a C1-6 alkyl group; and R^1 is hydrogen, halogen, or a C1-6 alkyl group capable of including halogen. A photoresist composition includes the resin.</p>
申请公布号 KR20130039690(A) 申请公布日期 2013.04.22
申请号 KR20120112391 申请日期 2012.10.10
申请人 SUMITOMO CHEMICAL CO., LTD. 发明人 ICHIKAWA KOJI;SAKAMOTO HIROMU;FUJITA SHINGO
分类号 C08F20/26;C08L33/04;G03F7/033;G03F7/20 主分类号 C08F20/26
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