摘要 |
<P>PROBLEM TO BE SOLVED: To provide a nitride semiconductor template having a low resistance (a surface resistivity of 20 Ω/sq. or less) and a good crystallinity (an XRD half value width of 50 seconds or more and 100 seconds or less), and to provide a light-emitting diode using the same. <P>SOLUTION: A nitride semiconductor template 10 has: a substrate 11; and a group-III nitride semiconductor layer 22 obtained by forming an O-doped GaN layer 13 on the substrate 11 as an O-additive layer to which O (oxygen) is added and forming an Si-doped GaN layer 14 on the O-doped GaN layer 13 as an Si-additive layer to which Si is added. A film thickness of the whole group-III nitride semiconductor layer is 4 μm or more and 10 μm or less. An average carrier concentration of Si in the Si-doped GaN layer 14 is 1×10<SP POS="POST">18</SP>cm<SP POS="POST">-3</SP>or more and 5×10<SP POS="POST">18</SP>cm<SP POS="POST">-3</SP>or less. <P>COPYRIGHT: (C)2013,JPO&INPIT |