FLASH MEMORY DEVICE CAPABLE OF VERIFYING RELIABILITY USING BYPASS PATH, AND SYSTEM AND METHOD OF VERIFYING RELIABILITY USING THAT DEVICE

摘要

PURPOSE: A flash memory storage device capable of verifying reliability by using a bypass path, a system and a method for verifying the reliability of the flash memory storage device are provided to objectively verify the reliability of a completely developed result. CONSTITUTION: A controller(101) controls a flash memory chip. A first connector(102) is formed for a first path between the flash memory chip and the controller. A second connector(103) is formed for a second path between the controller and a test support system to test a flash memory storage device. The controller selectively activates the first path or the second path. [Reference numerals] (100) Flash memory storage device; (101) Controller; (104) Flash memory chip; (110) Test support system; (130) Host; (140) Host interface;