发明名称 THREE DIMENSIONAL IC METHOD AND DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of three-dimensionally integrating elements such as singulated dies or wafers and an integrated structure having connected elements such as singulated dies or wafers. <P>SOLUTION: Either or both of the die and wafer have semiconductor devices formed therein. A first element having a first contact structure is bonded to a second element having a second contact structure. The first and second contact structures can be exposed at bonding and is electrically interconnected as a result of the bonding. A via may be etched and filled after bonding to expose and form an electrical interconnect to interconnect the first and second contact structures and provide electrical access to this interconnect from a surface. Alternatively, the first and/or second contact structures are not exposed at bonding, and a via is etched and filled after bonding to electrically interconnect the first and second contact structures and provide electrical access to the interconnected first and second contact structures. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013058781(A) 申请公布日期 2013.03.28
申请号 JP20120246660 申请日期 2012.11.08
申请人 ZIPTRONIX INC 发明人 PAUL M ENGQUIST;GAIUS GILLMAN FOUNTAIN JR;TONG QIN-YI
分类号 H01L27/00;H01L21/3205;H01L21/768;H01L23/522;H01L25/065;H01L25/07;H01L25/18 主分类号 H01L27/00
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