| 摘要 |
A hot gas path measurement apparatus is provided and includes a substrate having a coating applied on a surface thereof such that the coating is interposed between the substrate and a hot gas path; and a measurement device fixed in a recess formed in the substrate, the measurement device including a sensor, and a holder configured to position the sensor in an alignment condition with a plane of a surface of the coating or at least partially within a span of the hot gas path.
|
