发明名称 COMPOSITIONS AND METHODS FOR CMP OF PHASE CHANGE ALLOYS
摘要 THE PRESENT INVENTION PROVIDES A CHEMICAL-MECHANICAL POLISHING (CMP) COMPOSITION SUITABLE FOR POLISHING A SUBSTRATE COMPRISING A PHASE CHANGE ALLOY (PCA), SUCH AS A GERMANIUM-ANTIMONY-TELLURIUM (GST) ALLOY. THE COMPOSITION COMPRISES NOT MORE THAN 6 PERCENT BY WEIGHT OF A PARTICULATE ABRASIVE MATERIAL IN COMBINATION WITH AN OPTIONAL OXIDIZING AGENT, AT LEAST ONE CHELATING AGENT, AND AN AQUEOUS CARRIER THEREFOR. THE CHELATING AGENT COMPRISES A COMPOUND OR COMBINATION OF COMPOUNDS CAPABLE OF CHELATING A PHASE CHANGE ALLOY OR COMPONENT THEREOF (E.G., GERMANIUM, INDIUM, ANTIMONY AND/OR TELLURIUM SPECIES) THAT IS PRESENT IN THE SUBSTRATE, OR CHELATING A SUBSTANCE THAT IS FORMED FROM THE PCA DURING POLISHING OF THE SUBSTRATE WITH THE CMP COMPOSITION. A CMP METHOD FOR POLISHING A PHASE CHANGE ALLOY-CONTAINING SUBSTRATE UTILIZING THE COMPOSITION IS ALSO DISCLOSED.
申请公布号 MY147946(A) 申请公布日期 2013.02.15
申请号 MY2008PI02866 申请日期 2008.07.30
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 DYSARD, JEFFREY;FEENEY, PAUL;ANJUR, SRIRAM
分类号 C09K13/00 主分类号 C09K13/00
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