发明名称 Method of fabricating semiconductor device
摘要 A method of fabricating a semiconductor device in which a plurality of conductive lines having a fine pitch and a uniform thickness can be formed is provided. The method includes forming a plurality of first conductive patterns in a insulation layer as closed curves, forming a plurality of mask patterns on the insulation layer, the mask patterns exposing end portions of each of the first conductive patterns, and forming a plurality of second conductive patterns in the insulation layer as lines by removing the end portions of each of the first conductive patterns.
申请公布号 US8361849(B2) 申请公布日期 2013.01.29
申请号 US201113183574 申请日期 2011.07.15
申请人 SAMSUNG ELECTRONICS CO., LTD.;RYU YONG-HWAN;SEO JUN;KANG EUN-YOUNG;HWANG JAE-SEUNG;KWON SUNG-UN 发明人 RYU YONG-HWAN;SEO JUN;KANG EUN-YOUNG;HWANG JAE-SEUNG;KWON SUNG-UN
分类号 H01L21/338;H01L21/336 主分类号 H01L21/338
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