Apparatus for generating high resolution surface topology map using surface profiling and surveying instrumentation

摘要

A profiling apparatus configured to generate a high-resolution surface topology map of a surface using surface profiling data combined with surveying data. The apparatus is configured to collect both a plurality of survey sample points and a plurality of profile sample points of the surface. The profile sample points are then correlated with the survey sample points in the Z direction. Once the correlation is performed, the correlated profile sample points are merged or filled-in between the survey sample points. The high-resolution surface topology map is generated from the merging of the survey and profile sample points. In various embodiments, the survey data may be generated using an inertial profiler, an inclinometer based walking device, or a rolling-reference type profile device.