| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test socket with promptly removable electric connection module for test efficiency improvement. <P>SOLUTION: A test socket comprises a test base part and at least one electric connection module. The at least one electric connection module is removably mounted within the test base part and the at least one electric connection module includes a frame and a conductive element, respectively. The frame has a receiving hole for accommodating and testing an IC. The conductive element is removably mounted under the frame. After long-time use, an ineffective electric connection module or its conductive element is promptly and easily exchanged for a new one or an effective one by directly removing the electric connection module from the test base part. Therefore, an idle time or a dead time of a test device is shortened and test efficiency is improved. <P>COPYRIGHT: (C)2013,JPO&INPIT |
