发明名称 Semiconductor chip with post-passivation scheme formed over passivation layer
摘要 The invention provides a semiconductor chip comprising an interconnecting structure over said passivation layer. The interconnecting structure comprises a first contact pad connected to a second contact pad exposed by an opening in a passivation layer. A metal bump is on the first contact pad and over multiple semiconductor devices, wherein the metal bump has more than 50 percent by weight of gold and has a height of between 8 and 50 microns.
申请公布号 US8319354(B2) 申请公布日期 2012.11.27
申请号 US201113181255 申请日期 2011.07.12
申请人 LIN MOU-SHIUNG;LO HSIN-JUNG;CHOU CHIEN-KANG;CHOU CHIU-MING;LIN CHING-SAN;MEGICA CORPORATION 发明人 LIN MOU-SHIUNG;LO HSIN-JUNG;CHOU CHIEN-KANG;CHOU CHIU-MING;LIN CHING-SAN
分类号 H01L23/52;H01L23/48;H01L29/40 主分类号 H01L23/52
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