发明名称 |
YIELD PREDICTION SYSTEM AND YIELD PREDICTION PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a yield prediction system that predicts a yield with high precision using manufacture data measured through sampling inspection on intermediate products. <P>SOLUTION: The yield prediction system includes: a manufacture data holding part 62 which holds manufacture data; a quality data holding part 61 which holds quality data; a product standard data holding part 64 which holds standard data; a quality data statistic prediction model construction part 10 which constructs a prediction model for statistics of the quality data by acquiring manufacture data corresponding to the quality data; quality data statistic prediction part 20 which predicts statistics of the quality data based upon manufacture data in manufacture units of an object of yield prediction using the prediction model; a probability distribution estimation part 30 which estimates a probability distribution of the quality data by substituting the statistics of the quality data in a probability distribution function of the quality data; a yield prediction part 40 which obtains a yield by calculating the number of products estimated to meet standards based upon the probability distribution of the quality data and the standard data; and an input/output part which outputs yield data. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012226511(A) |
申请公布日期 |
2012.11.15 |
申请号 |
JP20110092757 |
申请日期 |
2011.04.19 |
申请人 |
HITACHI LTD |
发明人 |
IMAZAWA KEI;KATSUMURA YOSHITERU;SUGINISHI YUICHI |
分类号 |
G05B19/418;G06Q10/04;G06Q50/04 |
主分类号 |
G05B19/418 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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