发明名称 YIELD PREDICTION SYSTEM AND YIELD PREDICTION PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide a yield prediction system that predicts a yield with high precision using manufacture data measured through sampling inspection on intermediate products. <P>SOLUTION: The yield prediction system includes: a manufacture data holding part 62 which holds manufacture data; a quality data holding part 61 which holds quality data; a product standard data holding part 64 which holds standard data; a quality data statistic prediction model construction part 10 which constructs a prediction model for statistics of the quality data by acquiring manufacture data corresponding to the quality data; quality data statistic prediction part 20 which predicts statistics of the quality data based upon manufacture data in manufacture units of an object of yield prediction using the prediction model; a probability distribution estimation part 30 which estimates a probability distribution of the quality data by substituting the statistics of the quality data in a probability distribution function of the quality data; a yield prediction part 40 which obtains a yield by calculating the number of products estimated to meet standards based upon the probability distribution of the quality data and the standard data; and an input/output part which outputs yield data. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012226511(A) 申请公布日期 2012.11.15
申请号 JP20110092757 申请日期 2011.04.19
申请人 HITACHI LTD 发明人 IMAZAWA KEI;KATSUMURA YOSHITERU;SUGINISHI YUICHI
分类号 G05B19/418;G06Q10/04;G06Q50/04 主分类号 G05B19/418
代理机构 代理人
主权项
地址