| 摘要 |
<P>PROBLEM TO BE SOLVED: To efficiently find out an inter-substrate conduction terminal of an electro-optical device with conduction failure when the conduction failure of the inter-substrate conduction terminal causes a trouble. <P>SOLUTION: Inter-substrate conduction terminals 1, 2, 3, and 4 are provided between four corners of a counter substrate 12 and a TFT substrate 11. Wires L<SB POS="POST">18</SB>and L<SB POS="POST">28</SB>are provided between an external circuit connection terminal 8 and the inter-substrate conduction terminals 1 and 2 of the TFT substrate 11. Wires L<SB POS="POST">12</SB>, L<SB POS="POST">13</SB>, L<SB POS="POST">34</SB>, and L<SB POS="POST">24</SB>are provided between the inter-substrate conduction terminals 1 and 2, between the inter-substrate conduction terminals 1 and 3, between the inter-substrate conduction terminals 3 and 4, and between the inter-substrate conduction terminals 2 and 4. A wire L<SB POS="POST">DTR1</SB>that makes detour around the inter-substrate conduction terminal 1 is provided between the wire L<SB POS="POST">18</SB>and a wire L<SB POS="POST">23</SB>. A wire L<SB POS="POST">DTR2</SB>that makes detour around the inter-substrate conduction terminal 2 is provided between the wire L<SB POS="POST">28</SB>and the wire L<SB POS="POST">24</SB>. <P>COPYRIGHT: (C)2013,JPO&INPIT |
