| 摘要 |
A short beam test fixture (101) includes a housing (103), a first grip (113), and a second grip (115). The first grip and the second grip are each configured to clamp onto an upper surface and lower surface of a material coupon. The test fixture (101) also includes an upper input jaw (125) and a lower input jaw (127) each configured to clamp onto the material coupon near a center of the upper surface and the lower surface of the material coupon. The test fixture (101) is configured to load the material coupon in a first direction and a second direction. The first grip (113) and the second grip (115) are each configured to clamp onto the material coupon at a location which accordingly results in a desired testing ratio regardless of a variation in thickness of the material coupon. |
