发明名称 |
SEMICONDUCTOR DEVICE CAPABLE OF BEING TESTED AFTER PACKAGING |
摘要 |
Provided is a semiconductor device capable of effectively testing whether memory cells and a memory cell array are defective. The semiconductor device may include a memory cell array having a plurality of memory cells and an external test pad connected to an internal test pad. A test voltage may be applied to the plurality of word lines connected to the plurality of memory cells via the external test pad and the internal test pad in a test mode, wherein the test voltage disables the plurality of word lines. |
申请公布号 |
US2012187977(A1) |
申请公布日期 |
2012.07.26 |
申请号 |
US201213437282 |
申请日期 |
2012.04.02 |
申请人 |
HONG HEE-IL;CHO KANG-YOUNG |
发明人 |
HONG HEE-IL;CHO KANG-YOUNG |
分类号 |
G01R31/26;H01L23/58 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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