发明名称 SUITABILITY DETERMINATION METHOD FOR DETERMINATION STANDARD VALUE AND METHOD FOR SPECIFYING OPTIMUM VALUE THEREOF, INSPECTION SYSTEM FOR SUBSTRATE ON WHICH COMPONENTS ARE MOUNTED, SIMULATION METHOD AT PRODUCTION SITE, AND SIMULATION SYSTEM
摘要 Suitability of determination standard value for intermediate inspection is determined. A correlation between measured values X for intermediate inspection and measured values Y for final inspection is derived. For each of calculation target points on X-axis, a distribution pattern of measured values Y is specified for measured value Xn of the point based on the correlation, and probabilities of a range determined to be non-defective by determination standard value of final inspection and a range determined to be defective that are included in the distribution are calculated. For each of the ranges of measured values X determined to be non-defective and defective based on the determination standard value of the intermediate inspection, a degree of consistency and a degree of inconsistency between results of inspections are determined using the probabilities. Suitability of the determination standard value is determined based on the two degrees.
申请公布号 US2012185221(A1) 申请公布日期 2012.07.19
申请号 US201113280627 申请日期 2011.10.25
申请人 MORI HIROYUKI;NAKAJIMA KATSUKI;TASAKI HIROSHI;OMRON CORPORATION 发明人 MORI HIROYUKI;NAKAJIMA KATSUKI;TASAKI HIROSHI
分类号 G06F17/10;G06F19/00 主分类号 G06F17/10
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