| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of accurately measuring electrical characteristics of an electronic part. <P>SOLUTION: In a method of accurately measuring electrical characteristics of an electronic part, a measuring substrate 22 is arranged in the second main surface 11b side of a wiring substrate 11 so as to electrically be connected to a terminal electrode 14, while pressure contact members 21a to 21d are arranged in the first main surface 11a side of the wiring substrate 11. A part on which chip components 12a, 12b of an electronic part 10 are not provided is relatively pressed to the measuring substrate 22 side through the pressure contact members 21a to 21d, thereby measuring the electrical characteristics of the electronic part 10 which is brought into pressure-contact with the measuring substrate 22. <P>COPYRIGHT: (C)2012,JPO&INPIT |
