| 摘要 |
In a method and an X-ray test system for testing identical components by means of X-rays, a first reference data record (R4) is calculated from a plurality of similar test data records (P1 to P11) which were each determined for a component by means of the X-ray test system. In order to test a subsequently produced component, the reference data record (R4) is compared to a test data record (P12) of said component. Thereafter, an updated reference data record (R5) is calculated from said test data record (P12) and previously determined test data records (P1 to P11) and, again in order to test a subsequently produced component, is compared to a test data record (P13) of said component. By constantly calculating an updated reference data record (R4, R5) for the testing of the components, subtle changes of the components, which however are within the quality requirements, can be taken into consideration such that pseudo detections are reliable avoided. |
