发明名称 |
Silver metallization by damascene method |
摘要 |
<p>A method of forming interconnects in an integrated circuit, comprising: forming a dielectric layer over a substrate; forming a groove (114) for an interconnect in the dielectric layer; forming an aluminium seed layer over the upper surface of the dielectric layer, over sidewalls of the groove, and over a bottom of the groove to a thickness of approximately 200 Å; zincating the substrate to form a zinc coating on the aluminium seed layer; plating the substrate with silver to form a conformal silver layer (116) on an upper surface of the dielectric layer and on sidewalls of the groove, filling an unfilled portion of the groove; and removing portions of the conformal silver layer on the dielectric layer, leaving a silver interconnect within the groove.</p> |
申请公布号 |
EP0973195(B1) |
申请公布日期 |
2012.04.11 |
申请号 |
EP19990304867 |
申请日期 |
1999.06.22 |
申请人 |
STMICROELECTRONICS, INC. |
发明人 |
CHAN, TSIU C.;CHIU, ANTHONY M.;SMITH, GREGORY C. |
分类号 |
H01L21/768;C23C18/31;C25D3/46;C25D7/12;H01L21/288;H01L21/3205;H01L23/52;H01L23/532 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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