发明名称 Imaging, Fabrication and Measurement Systems and Methods
摘要 A fabrication system comprises one of a substrate and work piece having at least one working surface, a tool coupled to a tool holder, at least one measurement system, and a control system. The at least one working surface comprises one or more regions. A first location of the tool, tool holder, and the one of a substrate and work piece are calibrated with reference to a coordinate system. The tool is adapted to affect creation of a device within the one or more regions. The at least one measurement system is adapted to obtain location information of at least a portion of at least one of the tool, tool holder, and one of a substrate and a work piece. The control system is adapted to receive the location information, determine a second location, and provide one or more output signals to one or more adjustment devices.
申请公布号 US2012062708(A1) 申请公布日期 2012.03.15
申请号 US201113233563 申请日期 2011.09.15
申请人 JOHNSON GREG;DOWSKI ED;SISSOM BRAD;ASCENTIA IMAGING, INC. 发明人 JOHNSON GREG;DOWSKI ED;SISSOM BRAD
分类号 H04N7/18;B23P19/00;H01L27/00;H04N13/02;H05K3/00 主分类号 H04N7/18
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