| 摘要 |
An LSI test apparatus includes a test circuit synthesizing unit that synthesizes a test circuit and inserts the test circuit in a pre-test-synthesis net list; a test pattern generating unit that, based on a post-test-synthesis net list acquired by the test circuit synthesizing unit, generates a test pattern that simultaneously activates selected gated clock buffers; a simulating unit that, using the test pattern generated by the test pattern generating unit, simulates operation of a circuit created from the post-test-synthesis net list; and a power source analyzing unit that analyzes voltage drop in terms of amount, based on operation rate information acquired by the simulating unit. |
