| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor circuit which can be tested efficiently, and a test method for the same. <P>SOLUTION: To test a semiconductor circuit, first, a basic format for test pattern including at least one argument and a test program for testing a semiconductor circuit to be tested is created and stored in a testing device. Next, a predetermined value is set for the argument, and a test pattern including the test program and the argument set with the predetermined value is created and supplied to the semiconductor circuit to be tested. Next, the test program is stored in a first address of a memory section which is provided in the semiconductor circuit and the argument set with the predetermined value is stored in a second address of the memory section. The test program stored in the first address is then executed while referring to the argument stored in the second address. <P>COPYRIGHT: (C)2012,JPO&INPIT |
