发明名称 |
Microscopic infrared analysis by X-ray or electron radiation |
摘要 |
An infrared (IR) emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared (IR) microscopy and performing microscopic infrared (IR) analysis by X-ray or electron radiation are provided. By utilizing nanometer sized X-ray beams or electron beams to produce IR emission, the spatial resolution of IR microscopy is extended. Simultaneously performing X-ray or electron-based spectroscopy as well as structural studies are enabled. |
申请公布号 |
US8106360(B2) |
申请公布日期 |
2012.01.31 |
申请号 |
US20100789823 |
申请日期 |
2010.05.28 |
申请人 |
ROSENBERG RICHARD A.;UCHICAGO ARGONNE, LLC |
发明人 |
ROSENBERG RICHARD A. |
分类号 |
G01J5/02 |
主分类号 |
G01J5/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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