发明名称 MASS SPECTROMETER
摘要 <P>PROBLEM TO BE SOLVED: To provide means for solving the inconvenience such as: the occurrence of the inconvenience of a mass spectrometer such as sensitivity deterioration and resolution deterioration due to a decline of the number of ions which reach a detector due to deviation of an axis of a constituent unit between an ion source and the detector, especially one or more orifice; and the occurrence of dispersion of performance caused by replacement of a component such as the orifice, considering such problems of the conventional arts. <P>SOLUTION: A configuration according to the present invention includes a mass spectrometer including: an ion source; a detector detecting ions; and an orifice and a mass separator arranged between the ion source and the detector. The mass spectrometer further includes an axis adjustment mechanism adjusting positions of axes of the orifice and/or the mass separator so that an opening of the orifice and/or an incident port of the mass separator are arranged along a straight line connecting the ion source and the incident port of the detector. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012009290(A) 申请公布日期 2012.01.12
申请号 JP20100144404 申请日期 2010.06.25
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 ISHIGURO KOJI;MOROKUMA HIDETOSHI
分类号 H01J49/06;G01N27/62 主分类号 H01J49/06
代理机构 代理人
主权项
地址