| 摘要 |
The machine tool monitoring device has a detection device (32) for the presence detection of a type of material and which has a sensor unit with at least one sensitivity range for radiation detection in a wave length range which is located at least partially in the infrared spectrum. The detection unit is provided for presence detection by evaluating a reflection spectrum of a radiation which is reflected onto a test object. An independent claim is included for a machine tool, especially a cutting or sawing machine, with a machine tool monitoring device. |
