| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an input device that solves a problem that, in the FTIR method, scattering angle characteristics of a scatterer causes the intensity difference of infrared light detected at a contact location, which results in reduction of the input accuracy. <P>SOLUTION: An input device 1 detects a state in which a scatterer 7 contacts with a contact surface 2a of a transparent plate 2 capable of wave-guiding a light into the inside thereof by an image on the contact plate 2a which is imaged by using scattering light generated by the scatterer 7, after correcting, by a correction processing part 9, unevenness of a detection light intensity due to a difference of a contact location caused by scattering characteristics of the scatterer 7. <P>COPYRIGHT: (C)2012,JPO&INPIT |
