发明名称 Process for deposition of semiconductor films
摘要 Chemical vapor deposition processes utilize higher order silanes and germanium precursors as chemical precursors. The processes have high deposition rates yet produce more uniform films, both compositionally and in thickness, than films prepared using conventional chemical precursors. In preferred embodiments, trisilane is employed to deposit SiGe-containing films that are useful in the semiconductor industry in various applications such as transistor gate electrodes.
申请公布号 US8067297(B2) 申请公布日期 2011.11.29
申请号 US20060642167 申请日期 2006.12.20
申请人 TODD MICHAEL A.;ASM AMERICA, INC. 发明人 TODD MICHAEL A.
分类号 C23C16/24;H01L21/20;C23C16/02;C23C16/42;C30B25/02;H01L21/205;H01L21/28;H01L21/285;H01L21/316;H01L21/331;H01L21/337;H01L21/425;H01L21/469;H01L21/8238;H01L27/092;H01L29/51;H01L29/737;H01L29/78;H01L31/18;H01L31/20 主分类号 C23C16/24
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