发明名称 Position measuring device for detecting relative position of scanning unit and reflection gauge moving in measuring direction, has diaphragm gaps arranged such that point light source is generated in detection level of primary-light source
摘要 <p>The device has a primary-light source (24) and a detector arrangement in a detection level, where the primary-light source and the detector arrangement are provided in a scanning unit. Two diaphragm gaps (25.1, 25.2) arranged in a light path of beam of rays emitted from the primary-light source such that a point light source (27) is precisely generated in the detection level of the primary-light source. The two diaphragm gaps are formed as an optical element in an integrated manner.</p>
申请公布号 DE102010028725(A1) 申请公布日期 2011.11.10
申请号 DE20101028725 申请日期 2010.05.07
申请人 DR. JOHANNES HEIDENHAIN GMBH 发明人 BENNER, ULRICH, DIPL.-PHYS.
分类号 G01B11/00 主分类号 G01B11/00
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