发明名称 Substrate with check mark and method of inspecting position accuracy of conductive glue dispensed on the substrate
摘要 The invention relates to a substrate with a check mark and a method of inspecting position accuracy of conductive glue dispensed on the substrate. The method is implemented on the substrate having at least one transfer pad and at least one check mark arranged near the border of the transfer pad. After the conductive glue spot is dispensed on the transfer pad, the method includes first capturing an image by a video capturing element, then determining whether the conductive glue spot exist in the image and determining whether the conductive glue spot from the image matches a predetermined standard, if not, generating a report and a warning.
申请公布号 US8044525(B2) 申请公布日期 2011.10.25
申请号 US20100760120 申请日期 2010.04.14
申请人 AU OPTRONICS CORPORATION 发明人 WANG SAN-CHI
分类号 H01L23/544 主分类号 H01L23/544
代理机构 代理人
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