发明名称 |
INDUCTIVELY COUPLED PLASMA MASS SPECTROMETER |
摘要 |
A mass analysis system including a sample inlet arranged to introduce a sample and an ion source coupled to the sample inlet and arranged to ionize a portion of the sample into ions. The system also includes a sampler element having a sample orifice arranged to receive the sample ions into a first vacuum chamber. The system includes a skimmer element having a skimmer orifice arranged to receive the sample ions from the first vacuum chamber into a second vacuum chamber where the skimmer orifice is of a first size. The system further includes a third cone element having a third cone orifice of a second size arranged to receive the sample ions from the second vacuum chamber into a third vacuum chamber where the third cone is configured to allow a continuum flow of ions through the third cone orifice. The third chamber includes an ion optics assembly and mass analyzer.
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申请公布号 |
US2011253888(A1) |
申请公布日期 |
2011.10.20 |
申请号 |
US201113033256 |
申请日期 |
2011.02.23 |
申请人 |
DH TECHNOLOGIES DEVELOPMENT PTE. LTD. |
发明人 |
BADIEI HAMID R.;BANDURA DMITRY;BARANOV VLADIMIR;KAHEN KAVEH;TANNER SCOTT |
分类号 |
H01J49/40;H01J49/00;H01J49/26 |
主分类号 |
H01J49/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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