| 摘要 |
In one embodiment, a measuring tool includes a transparent sheet; a first pattern of markings on the transparent sheet for measuring characteristics of a test sheet; and a second pattern of markings on the transparent sheet for measuring characteristics of a target image printed on the test sheet. In another embodiment, a measuring tool includes a transparent substrate and a reference image on the transparent substrate. The reference image includes an alignment pattern for aligning the reference image, a first scale for measuring distances in a first direction, a second scale for measuring distances in a second direction perpendicular to the first direction, and a skew pattern for measuring perpendicularity.
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