A METHOD AND APPARATUS FOR ACCURATE DETERMINATION OF PARAMETERS OF A STACK OF THIN FILMS,申请号IL20110214467-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	A METHOD AND APPARATUS FOR ACCURATE DETERMINATION OF PARAMETERS OF A STACK OF THIN FILMS
摘要
申请公布号	IL214467(D0)	申请公布日期	2011.09.27
申请号	IL20110214467	申请日期	2011.08.04
申请人	BRIGHTVIEW SYSTEM LTD;FINAROV MOSHE	发明人
分类号	H01L	主分类号	H01L
代理机构		代理人
主权项
地址

您可能感兴趣的专利

SUBSTRATE PROCESSING SYSTEM

CROSS-COUPLED MOS TRANSISTOR CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

CONTROLLED RELEASE CERAMIC PARTICLES

SENSITIZATION OF CHEMOTHERAPEUTIC AGENT RESISTANT NEOPLASTIC CELL WITH REOVIRUS

CLEANING DEVICE

INDICATOR FOR VEHICLE

POWDER MOLDING PRESS MACHINE

WIRELESS INFORMATION DISTRIBUTION DEVICE

ENGINE SUPPORT STRUCTURE

RECORDING DEVICE/METHOD/MEDIUM AND REPRODUCING DEVICE/METHOD

MAIL MONITORING SYSTEM, MAIL MONITORING PROGRAM, MAIL MONITORING DEVICE AND MAIL MONITORING METHOD

PATTERN FORMING METHOD AND PATTERN FORMING APPARATUS

INDUCTION HEATING APPARATUS AND METHOD FOR CONTROLLING THE SAME

3D IMAGE DISPLAY APPARATUS AND DISPLAY METHOD THEREOF

Inter-Processor Protocol in a Multi-Processor System

METHODS AND SYSTEMS FOR AUTOMATED SEARCHING

SOLVENT RESISTANT THERMOPLASTIC TOUGHENED EPOXY