EQUIPMENT FOR MEASURING DEFORMATION OF STRUCTURE AND DEFORMATION MEASURING METHOD OF STRUCTURE USING THE SAME,申请号KR20100021472-传众专利搜索

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发明名称	EQUIPMENT FOR MEASURING DEFORMATION OF STRUCTURE AND DEFORMATION MEASURING METHOD OF STRUCTURE USING THE SAME
摘要
申请公布号	KR20110102036(A)	申请公布日期	2011.09.16
申请号	KR20100021472	申请日期	2010.03.10
申请人	INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY;TECHNOVALUE CO., LTD.	发明人	HAAM, SEUNG JOO;LIM, YUN MOOK;LIM, YOON CHEOL;PARK, JO SEPH
分类号	G01B21/32;B82B3/00;G01B7/16;G01B11/16	主分类号	G01B21/32
代理机构		代理人
主权项
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