发明名称 SUBSTRATE WIRING METHOD AND SEMICONDUCTOR MANUFACTURING DEVICE
摘要 <p>The disclosed substrate wiring method can embed copper all the way to the lowest parts of a wiring pattern formed on a substrate. Said method is used to wire a substrate inside a processing vessel (100) kept in a vacuum state, said substrate having a wiring pattern formed thereon. Said method is characterized by the inclusion of: a preprocess in which a desired cleaning gas is used to clean the wiring pattern on the wafer; and an embedding step, after the preprocess, in which a clustered metal gas (metal gas clusters (Cg)) is used to embed metal nanoparticles inside the wiring pattern.</p>
申请公布号 WO2011111524(A1) 申请公布日期 2011.09.15
申请号 WO2011JP53893 申请日期 2011.02.23
申请人 TOKYO ELECTRON LIMITED;IWATANI CORPORATION;HOSHINO, SATOHIKO;MATSUI, HIDEFUMI;NARUSHIMA, MASAKI 发明人 HOSHINO, SATOHIKO;MATSUI, HIDEFUMI;NARUSHIMA, MASAKI
分类号 H01L21/3205;C23C14/32;H01L21/28;H01L21/285;H01L23/52 主分类号 H01L21/3205
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