发明名称 |
SUBSTRATE WIRING METHOD AND SEMICONDUCTOR MANUFACTURING DEVICE |
摘要 |
<p>The disclosed substrate wiring method can embed copper all the way to the lowest parts of a wiring pattern formed on a substrate. Said method is used to wire a substrate inside a processing vessel (100) kept in a vacuum state, said substrate having a wiring pattern formed thereon. Said method is characterized by the inclusion of: a preprocess in which a desired cleaning gas is used to clean the wiring pattern on the wafer; and an embedding step, after the preprocess, in which a clustered metal gas (metal gas clusters (Cg)) is used to embed metal nanoparticles inside the wiring pattern.</p> |
申请公布号 |
WO2011111524(A1) |
申请公布日期 |
2011.09.15 |
申请号 |
WO2011JP53893 |
申请日期 |
2011.02.23 |
申请人 |
TOKYO ELECTRON LIMITED;IWATANI CORPORATION;HOSHINO, SATOHIKO;MATSUI, HIDEFUMI;NARUSHIMA, MASAKI |
发明人 |
HOSHINO, SATOHIKO;MATSUI, HIDEFUMI;NARUSHIMA, MASAKI |
分类号 |
H01L21/3205;C23C14/32;H01L21/28;H01L21/285;H01L23/52 |
主分类号 |
H01L21/3205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|