发明名称 Post deposition method for regrowth of crystalline phase change material
摘要 Techniques for forming a phase change memory cell. An example method includes forming a bottom electrode within a substrate. The method includes forming a phase change layer above the bottom electrode. The method includes forming a capping layer and an insulator layer. The method includes crystallizing the phase change material in the phase change layer so that the phase change layer is void free. The method further comprises heating the phase change material in the phase change layer from the bottom electrode and as a result the phase change layer is crystallized from the bottom to the top. In one embodiment, a rapid thermal anneal (RTA) is applied for crystallizing the phase change material.
申请公布号 US8017433(B2) 申请公布日期 2011.09.13
申请号 US20100702406 申请日期 2010.02.09
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LAM CHUNG H.;ROSSNAGEL STEPHEN M.;SCHROTT ALEJANDRO G.
分类号 H01L21/06;H01L21/00 主分类号 H01L21/06
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