| 摘要 |
PROBLEM TO BE SOLVED: To provide a solid-state imaging apparatus and a defective pixel detecting method thereof for greatly shortening a time for inspecting a defective pixel in comparison with the conventional practice. SOLUTION: Signals are simultaneously output from all pixels 20 of a pixel array 11 to a plurality of vertical signal lines 21<SB>1</SB>to 21<SB>n</SB>respectively wired for each of the prescribed number of pixel columns in the pixel array 11. The signals simultaneously output to the respective vertical signal lines 21<SB>1</SB>to 21<SB>n</SB>are added together for each vertical signal line 21<SB>1</SB>to 21<SB>n</SB>, and when the signal added in this way is at a level equal to or more than a predetermined threshold, a pixel column that outputs the added signal is determined as a defective pixel column. COPYRIGHT: (C)2011,JPO&INPIT
|
