发明名称 NONPLANAR III-N TRANSISTORS WITH COMPOSITIONALLY GRADED SEMICONDUCTOR CHANNELS
摘要 A III-N semiconductor channel is compositionally graded between a transition layer and a III-N polarization layer. In embodiments, a gate stack is deposited over sidewalls of a fin including the graded III-N semiconductor channel allowing for formation of a transport channel in the III-N semiconductor channel adjacent to at least both sidewall surfaces in response to a gate bias voltage. In embodiments, a gate stack is deposited completely around a nanowire including a III-N semiconductor channel compositionally graded to enable formation of a transport channel in the III-N semiconductor channel adjacent to both the polarization layer and the transition layer in response to a gate bias voltage.
申请公布号 US2014175515(A1) 申请公布日期 2014.06.26
申请号 US201213725546 申请日期 2012.12.21
申请人 THEN Han Wui;DASGUPTA Sansaptak;RADOSAVLJEVIC Marko;CHU-KUNG Benjamin;SUNG Seung Hoon;GARDNER Sanaz K.;CHAU Robert S. 发明人 THEN Han Wui;DASGUPTA Sansaptak;RADOSAVLJEVIC Marko;CHU-KUNG Benjamin;SUNG Seung Hoon;GARDNER Sanaz K.;CHAU Robert S.
分类号 H01L29/772;H01L29/66 主分类号 H01L29/772
代理机构 代理人
主权项 1. A non-planar III-N transistor disposed on a substrate, the transistor comprising: two wide band gap material layers on opposite {0001} surfaces of a III-N semiconductor channel that has a compositional grading along the c-axis between the two wide band gap III-N layers; a gate stack comprising a gate dielectric and gate electrode, the gate stack disposed over opposing surfaces of the semiconductor channel that span a distance between the two wide band gap material layers; and a pair of source/drain regions embedded in or coupled to the non-planar III-N semiconductor body at opposite sides of the gate stack.
地址 Portland OR US