发明名称 Mask patterns including gel layers for semiconductor device fabrication
摘要 Mask patterns include a resist pattern and a gel layer on a surface of the resist pattern having a junction including hydrogen bonds between a proton donor polymer and a proton acceptor polymer. Methods of forming the mask patterns and methods of fabricating a semiconductor device using the mask patterns as etching masks are also provided.
申请公布号 US7985529(B2) 申请公布日期 2011.07.26
申请号 US20090496185 申请日期 2009.07.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HATA MITSUHIRO;KIM HYUN-WOO;HAH JUNG-HWAN;WOO SANG-GYUN
分类号 G03F7/11;G03F7/40;H01L21/027 主分类号 G03F7/11
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