发明名称 Electronic device
摘要 One embodiment provides a method of manufacturing semiconductor devices. For example, a sawn and expanded wafer is utilized having dielectrical material deposited between the diced and deposited chips. The method includes placing at least two chips on a metallic layer, depositing mold material on the metallic layer and between the chips, and selectively removing a portion of the mold material from the metallic layer to selectively expose a portion of the metallic layer. The method additionally includes covering the selectively exposed portion of the metallic layer with a conductive material, and singulating the at least two chips.
申请公布号 US7968378(B2) 申请公布日期 2011.06.28
申请号 US20080026675 申请日期 2008.02.06
申请人 INFINEON TECHNOLOGIES AG 发明人 MAHLER JOACHIM;FUERGUT EDWARD;VERVOORT LOUIS
分类号 H01L21/00 主分类号 H01L21/00
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