发明名称 Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit
摘要 In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers (3, 4) biased in opposite directions by a coil spring (2), to be electrically connected to a wiring plate (10), have electrical connections in which, in a tubular portion (15) as a tight wound spiral portion (15a) fixed on one plunger (4) to allow linear flow of electrical signal, the other plunger (3) is brought into slidable contact.
申请公布号 US7969170(B2) 申请公布日期 2011.06.28
申请号 US20080219099 申请日期 2008.07.16
申请人 NHK SPRING CO., LTD. 发明人 KAZAMA TOSHIO
分类号 G01R31/20;G01R1/067;H01L21/66 主分类号 G01R31/20
代理机构 代理人
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