发明名称 Charged balanced devices with shielded gate trench
摘要 This invention discloses a semiconductor power device disposed on a semiconductor substrate includes a plurality of deep trenches with an epitaxial layer filling said deep trenches and a simultaneously grown top epitaxial layer covering areas above a top surface of said deep trenches over the semiconductor substrate. A plurality of trench MOSFET cells disposed in said top epitaxial layer with the top epitaxial layer functioning as the body region and the semiconductor substrate acting as the drain region whereby a super-junction effect is achieved through charge balance between the epitaxial layer in the deep trenches and regions in the semiconductor substrate laterally adjacent to the deep trenches. Each of the trench MOSFET cells further includes a trench gate and a gate-shielding dopant region disposed below and substantially aligned with each of the trench gates for each of the trench MOSFET cells for shielding the trench gate during a voltage breakdown.
申请公布号 US2011147836(A1) 申请公布日期 2011.06.23
申请号 US20110932172 申请日期 2011.02.17
申请人 HEBERT FRANCOIS 发明人 HEBERT FRANCOIS
分类号 H01L27/088;H01L21/8234 主分类号 H01L27/088
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