发明名称 Semiconductor device including groove width variation portion for inspection
摘要 An accelerator sensor includes a semiconductor substrate having a main front surface and a main rear surface, a first groove portion being formed along a front surface pattern, in the main front surface, a second groove portion being formed along a rear surface pattern, in the main rear surface, a through-hole being formed because of connection between at least parts of the first groove portion and the second groove portion and at least one groove width variation portion being formed in at least one of inner walls of the first groove portion. An offset of the rear surface pattern to the front surface pattern can be inspected easily by existence of the groove width variation portion.
申请公布号 US7956430(B2) 申请公布日期 2011.06.07
申请号 US20090556856 申请日期 2009.09.10
申请人 OKI SEMICONDUCTOR CO., LTD. 发明人 TASAKI YOSHIHIDE
分类号 H01L29/84 主分类号 H01L29/84
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